Automatic test pattern generation for multi - clock digital system based on s amp; amp; cct 基于安全充分捕获技术的多时钟数字系统测试矢量生成
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An automatic test pattern generation ( atpg ) algorithm for deliberately selected delay faults is presented to cope with the crosstalk - induced delay effects on longer paths 由于电路中较长的通路具有较短的松弛时间,因此容易因为串扰问题产生时延故障。